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Simulated On-Board AI-Based Classification of Radiation-Induced SRAM Event Upsets

Simulated On-Board AI-Based Classification of Radiation-Induced SRAM Event Upsets

publishedDate Venue Electronics

Source-permitted summary

Simulated On-Board AI-Based Classification of Radiation-Induced SRAM Event Upsets

SourceMultidisciplinary Digital Publishing Institute

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Simulated On-Board AI-Based Classification of Radiation-Induced SRAM Event Upsets
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Compute and Hardware
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  1. paperSimulated On-Board AI-Based Classification of Radiation-Induced SRAM Event Upsets